Super-resolution microscopy™, also called nasoscopy, allows for observation of fluorescent samples at resolutions below the limit the diffraction of light imposes on any optical microscope.
SIM relies on laser-based wide-field microscopy set-up to which a movable diffraction grating has been inserted into the excitation beam path. Zero order and/or only first order diffracted laser beams (respectively to achieve 3D- or 2D-SIM) are let to pass through the objective. These laser beams interfere with each other at the focal plane of the objective and create an illumination in stripes.
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